As a part of the CODENET TMR program two short
courses will be help at the ETH in Zurich. These courses are not only open
to all CODENET participants but also to other nannofossil workers. If you
want to participate please email.
CODENET SHORT COURSE at ETHZ: CALCAREOUS NANNOFOSSILS
v. Salis, Dr J. Bollmann)
Monday, 5. - Friday, 9. October 1998
The program is flexibel and can be adapted to the needs and wishes
of the participants. We propose the following topics and are open to additional
Use of SEM and Image analysis
Preparation methods for quantitative analyses (coccoliths/g sed.)
Katharina von Salis
Light microscope study of fossil representatives of Coccolithaceae
preparation of simple smearslides
Recognising reworked specimens: short introduction to the most often reworked
Tertiary and Cretaceous species that you may encounter in Holocene sediment
Preservation of coccolithophorids >> fossil assemblages
Biostratigraphical markers in the Cretaceous and the Cenozoic
fossil species considered ãcoldä and ãwarmä
fossil species considered to indicate oligotrophic to eutrophic conditions
CODENET SHORT COURSE at ETHZ: Scanning Electron Microscopy
(Dr K. Kunze, Dr
Monday, 12. - Friday, 16. Oktober 1998
Introduction to scanning electron microscopy and microanalysis for
earth scientists. Gain practical experience in application and operation
of a SEM. The course is intended for graduate students and post-graduate
researchers, who want to apply SEM techniques in their research. Participants
are invited to bring their own samples for analysis.
Design and basic operation modes of a scanning electron microscope.
Methods and applications for imaging (SE, BSE, FSE, AE, CL),
X-ray spectroscopy (EDX),
electron diffraction (EBSD, channeling, orientation imaging).
Quantitative image analysis and morphometry.
Sample preparation techniques.
Reed: Electron microprobe analysis and scanning electron microscopy
in geology. Cambridge University Press (1996).
Schmidt: Praxis der Rasterelektronenmikroskopie und Mikrobereichsanalyse.
Expert.Verlag Renningen-Malmsheim (1994).
Reimer, Pfefferkorn: Rasterelektronenmikroskopie. Springer Berlin
Goldstein et al: Scanning electron microskopy and X-ray analysis.
Plenum Press New York London (1981).